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Tom has 180 publications including 4 book chapters, 46 U. He has also received the honor of being named an ICDD Distinguished Fellow. in 1982 using neutron diffraction to do structural studies on magnetic intermetallics and their hydrides. Crowder joined the Dow Chemical Company in 1982 and has been active in the field of X-ray diffraction since that time.

Building marketing and business ties with OEMs and 3rd party developers. Timothy Fawcett Denver X-ray Conference Organizing Committee, Chairman Thornton, PA Tim received his B. in Chemistry at the University of Massachusetts and a Ph. degree in Inorganic Chemistry at Rutgers University.

He worked at the Dow Chemical Company from 1979-2001 and then was Executive Director of the ICDD until his retirement in 2017.

He was responsible for the operation of the X-ray Spectroscopy Laboratory, utilizing diffractometers for powder, pole figure, nonambient, high-resolution, reflectivity, and two-dimensional XRD.

Materials analyzed included inorganics, organics, solid state devices, thin films, corrosion products, ceramics, pharmaceuticals, polymers, and nanomaterials.

During his career, Tim has authored over 60 publications, been a frequent guest lecturer, and presented several papers and workshops at global X-ray conferences.

Several of his publications have been incorporated in the book, Methods & Practices in X-ray Diffraction, published by the ICDD. Madison, Wisconsin The owner of Anzelmo and Associates, Inc., a firm providing Analytical X-ray and sample preparation consultation as well as marketing and business consultation to high tech firms, John is currently the Technical Program Director for the ICDD XRF clinics.John has 41 years of experience in the fields of X-ray Fluorescence/X-ray Diffraction Analyses as Applications Scientist, Laboratory Manager, Product Manager, Marketing Manager and President for Applied Research Laboratories, Bruker AXS, and Claisse USA.He has also written over forty publications and given hundreds of presentations worldwide. in Chemistry from Loyola University, IL and graduate studies at the University of Wisconsin-Milwaukee.John currently serves on the Denver X-ray Conference Organizing Committee, on the Comité de Direction of Corporation Scientifique Claisse, on the Board of Directors for the ICDD, and is a Fellow of the ICDD. Areas of expertise: XRF - applications, calibration, sample preparation, instrument design; XRD - quantitative analysis. Madison, WI Larry is the Manager XRF – US Applications for Bruker AXS.Tom was also the Technical Leader in the Specialty Materials Development Laboratory.

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